Document Details Document Type : Article In Journal  Document Title : Resolution degradation of semiconductor detectors Resolution degradation of semiconductor detectors   Subject : Resolution degradation of semiconductor detectors  Document Language : English  Abstract : Incomplete charge collection in semiconductor X-ray detectors due to carrier trapping is recognized as an important source of signal broadening. In this paper we show the results of calculations of energy resolution for a TlBr detector usingan analytic approach developed in our earlier work in which fluctuations in the distribution of photon absorption sites are related to fluctuations in the collected charge. Using measured values of transport parameters for electrons and holes in the detector material we obtained excellent agreement with experiment in the X-ray energy range 6–660 keV. r 2005 Elsevier B.V. All rights reserved.  ISSN : 0168-9002  Journal Name : Nuclear Instruments and Methods in Physics Research  Volume : 546  Issue Number : 2  Publishing Year : 1426 AH 2005 AD  Number Of Pages : 4  Article Type : Article  Added Date : Monday, June 15, 2009  Researchers Researcher Name (Arabic) Researcher Name (English) Researcher Type Dr Grade Email Alexander G. Alexander G. Investigator Doctorate   J. Keith J. Keith Researcher Doctorate   Owens Owens Researcher Doctorate   den Hartog den Hartog Researcher Doctorate   Peacock Peacock Researcher Doctorate   Al-Jawhari Al-Jawhari Researcher Doctorate   Back To Researches Page